MUFRON, A.; WEI, Z. Applying Biometric Technology in School Attendance and Security Management . Al-Hijr: Journal of Adulearn World, [S. l.], v. 3, n. 2, p. 310–322, 2024. DOI: 10.55849/alhijr.v3i2.667. Disponível em: https://ejournal.staialhikmahpariangan.ac.id/Journal/index.php/alhijr/article/view/667. Acesso em: 17 nov. 2025.